Rajeev Ahuja, Uppsala University, Sweden
Martin Dornheim, Helmholtz Association, Germany
Etsuo Akiba, Kyushu University, Japan
Haiwen Li, Kyushu University, Japan
Zhenguo Huang, University of Wollongong, Australia
IEA-HIA Task 32
Hui Wu , 美国国家标准与技术研究院(National Institute of Standardsand Technology, NIST, USA)
吴安安, 厦门大学
Yuanping Feng, National University of Singapore
Tejs Vegge, Technical University of Denmark
S Thomas Autrey, Pacific Northwest National Laboratory, USA
